Institute of Crystallography - CNR

Characterization of materials by hard X-ray diffraction from synchrotron light source

Characterize materials (surfaces, soft matter, powders) by hard X-ray diffraction from synchrotron light source:
• recognition of phases
• indexing and identification of orientations with respect to surfaces
• profile analysis, crystallinity evaluation
• characterization of phase transitions

Assistance in the presentation of proposals for experiments in synchrotron light:
Characterize materials (surfaces, soft matter, powders) by hard X-ray diffraction from a synchrotron light source:
• recognition of phases
• indexing and identification of orientations with respect to surfaces
• profile analysis, crystallinity evaluation
• characterization of phase transitions
User assistance, collaboration in the reduction, representation and interpretation of the experimental data.

Reference works

– Bhattarai, M.; Penttilä, P.; Barba, L.; Macias-Rodriguez, B.; Hietala, S.; Mikkonen, K. S.; Valoppi, F. Size-Dependent Filling Effect of Crystalline Celluloses in Structural Engineering of Composite Oleogels. LWT 2022, 160, 113331. https://doi.org/10.1016/j.lwt.2022.113331.
– Vohra, V.; Matsunaga, Y.; Takada, T.; Kiyokawa, A.; Barba, L.; Porzio, W. Impact of the Electron Acceptor Nature on the Durability and Nanomorphological Stability of Bulk Heterojunction Active Layers for Organic Solar Cells. Small 2021, 17 (2), 2004168. https://doi.org/10.1002/smll.202004168.
– Calabrese, G.; Pipitone, C.; Marini, D.; Giannici, F.; Martorana, A.; Barba, L.; Summonte, C.; Masciocchi, N.; Milita, S. Highly Stable Thin Films Based on Novel Hybrid 1D (PRSH)PbX3 Pseudo-Perovskites. Nanomaterials 2021, 11 (10), 2765. https://doi.org/10.3390/nano11102765.
– Boota, M.; Hussain, T.; Yang, L.; Bécuwe, M.; Porzio, W.; Barba, L.; Ahuja, R. Mechanistic Understanding of the Interactions and Pseudocapacitance of Multi-Electron Redox Organic Molecules Sandwiched between MXene Layers. Advanced Electronic Materials 2021, 7 (4), 2001202. https://doi.org/10.1002/aelm.202001202.

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